Scanning Electron Microscope

Institute: North-Eastern Hill University, Shillong

Area: Life Sciences & Biotechnology

Types of Facilities: Testing

Make Model: Jeol JSM 6360

Major Specifications/Accessories available: Magnification: upto 3,00,000x, Resolution: 3 nm, Acc. voltage: upto 30 kV (55 steps), Maximum Specimen size: 4.0 mm, Fully computer controlled.

Type of measurement/Analysis Available: Surface topographic studies of microstructures on bulk specimens of biological/non-biological nature. The SEM can accommodate 4 mm diameter specimen and allows observing full coverage of specimen with X, Y and R (rotation) movements of the specimen stage.