Engineering Sciences, Energy Sciences


Dual Energy X-Ray Image Analysis Technique for Material Discrimination


Engineering Sciences, Energy Sciences

Focus Area:

Technology developed for material discrimination

Developing Agency:

CSIR-Central Electronics Engineering Research Institute CEERI, Pilani

Technology Readiness Index:

Technology Demonstration

Brief Description

Description :

Material discrimination technique was developed to discriminate and identify the material based on their atomic number found in the range 6-29.This technique takes two distinct images under dual energy X-ray imaging scheme. In order to obtain chemical composition and morphological distribution of the material, it combines the low energy data with high energy data.It determines the atomic number and density values to differentiate the material types