Research

Physical Sciences

Title :

Development of Spectrally Resolved white light interferometer for roughness and flatness measurement of engineering sample

Area of research :

Physical Sciences

Focus area :

Engineering

Principal Investigator :

Dr. Sanjit Kumar Debnath, CSIR-Central Scientific Instruments Organisation, Chandigarh, Punjab (160030)

Timeline Start Year :

2024

Timeline End Year :

2027

Contact info :

Details

Executive Summary :

The objective is to develop a cost-effective optical instrument to measure roughness and flatness of engineering surfaces in vibration-sensitive environments. The Spectrally Resolved White Light Interferometry (SRWLI) method consists of an interferometer and spectroscope, which disperses white light interference patterns between the test and reference surfaces. The recorded interferogram is processed by a phase measurement algorithm. The project involves designing and fabricating the spectroscope, studying single-frame phase measurement algorithms, oto-mechanical design and assembly of the interferometer, integrating software with hardware, testing on standard samples, and developing a field deployable prototype. The SRWLI is based on white light interferometry, which is an incoherent superposition of a large number of monochromatic interferograms. The aim is to determine the phase Phiz, sigma as a function of sigma and determine z at any point on the test surface by a slope calculation. The phase ϯªz, sigma can be calculated using various methods like Fourier Transform and Hilbert Transform. This method is suitable for the Indian automobile industry, as it does not require vibration isolation and is cost-effective.

Co-PI:

Dr. Shravan Kumar RR, CSIR-Central Scientific Instruments Organisation, Chandigarh, Punjab (160030)

Total Budget (INR):

28,18,463

Organizations involved