Research
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Title : | Reliability of SiGe channel pMOSFET's |
Area of research : | Engineering Sciences |
Focus area : | SiGe channel |
Principal Investigator : | Dr. Deleep R. Nair, Associate Professor, Department of Electrical Engineering, Indian Institute of Technology (IIT), Chennai, Tamil Nadu |
Timeline Start Year : | 2016 |
Contact info : | deleep[at]iitm[dot]ac[dot]in |
Details
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Total Budget (INR): | 68,89,080 |
Organizations involved
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