Research
Title : | Large-signal RF reliability modeling & characterization of hot carrier degradation in 10- Nm FinFETs |
Area of research : | Engineering Sciences |
Focus area : | Device Physics and Reliability Engineering |
Principal Investigator : | Dr. A. Dixit, Associate Professor, Indian Institute of Technology (Delhi) |
Timeline Start Year : | 2019 |
Details
Total Budget (INR): | 64,49,696 |
Organizations involved
Implementing Agency : | Indian Institute of Technology (Delhi) Funding Agency :Department of Science and Technology (DST) | |