NEHU, Shillong
Type of facility:
Testing
Name of the Facility:
Scanning Electron Microscope
Make Model:
Jeol JSM 6360
Type of measurement/ Analysis Available:
Surface topographic studies of microstructures on bulk specimens of biological/non-biological nature. The SEM can accommodate 4 mm diameter specimen and allows observing full coverage of specimen with X, Y and R (rotation) movements of the specimen stage.
Application:
NA
Major Specifications/ Accessories available:
Magnification: upto 3,00,000x
Resolution: 3 nm
Acc. voltage: upto 30 kV (55 steps)
Maximum Specimen size: 4.0 mm
Fully computer controlled.