STIC, Kochi
Area:
Type of facility:
Testing
Name of the Facility:
Scanning Electron Microscope (with EDS)
Make Model:
Jeol 6390LV
Type of measurement/ Analysis Available:
Surface topography and morphology of materials as well as biological samples EDS for elemental detection and analysis
Application:
NA
Major Specifications/ Accessories available:
Accelerating voltage: 0.5 kV to 30 kV Resolution: 4 nm (30 kV) Magnification: 300,000 EDS Attachment