Research

Engineering Sciences

Title :	Reliability of SiGe channel pMOSFET's
Area of research :	Engineering Sciences
Focus area :	SiGe channel
Principal Investigator :	Dr. Deleep R. Nair, Associate Professor, Department of Electrical Engineering, Indian Institute of Technology (IIT), Chennai, Tamil Nadu
Timeline Start Year :	2016
Contact info :	deleep@iitm.ac.in

68,89,080

Implementing Agency :	Department of Electrical Engineering, Indian Institute of Technology (IIT), Chennai, Tamil Nadu
Funding Agency :	Science and Engineering Research Board (SERB), Department of Science & Technology (DST), Government of India